Erik Vilain Thomsen

Erik Vilain Thomsen

Professor

DTU NANOTECH
Department of Micro- and Nanotechnology

Technical University of Denmark

Ørsteds Plads

Building 344, room 028

2800 Kgs. Lyngby

Ph.
Mobile
Fax +45 45 88 77 62
E-mail ervt@nanotech.dtu.dk
ORCID 0000-0002-2772-926X

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2017
 

Micro-fabricated all optical pressure sensors

Havreland, Andreas Spandet ; Petersen, Søren Dahl ; Østergaard, Christian ; Reck-Nielsen, Kasper ; Thomsen, Erik Vilain
in journal: Microelectronic Engineering (ISSN: 0167-9317) (DOI: http://dx.doi.org/10.1016/j.mee.2016.12.010), vol: 174, pages: 11-15, 2017

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: http://dx.doi.org/10.1016/j.mee.2016.12.010

  PDF

Curvilinear 3-D Imaging Using Row--Column-Addressed 2-D Arrays with a Diverging Lens: Feasibility Study

Bouzari, Hamed ; Engholm, Mathias ; Beers, Christopher ; Stuart, Matthias Bo ; Nikolov, Svetoslav Ivanov ; Thomsen, Erik Vilain ; Jensen, Jørgen Arendt
in journal: IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control (ISSN: 0885-3010) (DOI: http://dx.doi.org/10.1109/TUFFC.2017.2687521), vol: 64, issue: 6, pages: 978-988, 2017

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: http://dx.doi.org/10.1109/TUFFC.2017.2687521

  PDF

Improved Focusing Method for 3-D Imaging using Row–Column-Addressed 2-D Arrays

Bouzari, Hamed ; Engholm, Mathias ; Stuart, Matthias Bo ; Thomsen, Erik Vilain ; Jensen, Jørgen Arendt
part of: Proceedings of the 2017 IEEE International Ultrasonics Symposium (IUS) (ISBN: 9781538633830), 2017, IEEE,
Presented at:
2017 IEEE International Ultrasonics Symposium (IUS), 2017, Washington

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: http://dx.doi.org/10.1109/ULTSYM.2017.8091596

  PDF

Transmitting Performance Evaluation of ASICs for CMUT-Based Portable Ultrasound Scanners

Llimos Muntal, Pere ; Diederichsen, Søren Elmin ; Jørgensen, Ivan Harald Holger ; Jensen, Jørgen Arendt ; Thomsen, Erik Vilain
part of: Proceedings of 2017 IEEE International Ultrasonics Symposium (IUS) (ISBN: 9781538633823), 2017, IEEE,
Presented at:
2017 IEEE International Ultrasonics Symposium (IUS), 2017, Washington

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: http://dx.doi.org/10.1109/ULTSYM.2017.8092913

  PDF

Performance evaluation of ASICs for CMUT-based portable ultrasound scanners

Llimos Muntal, Pere ; Diederichsen, Søren Elmin ; Jensen, Jørgen Arendt ; Jørgensen, Ivan Harald Holger ; Thomsen, Erik Vilain
part of: Proceedings of the 2017 IEEE International Ultrasonics Symposium (ISBN: 9781538633830), pages: 1-1, 2017, IEEE,
Presented at:
2017 IEEE International Ultrasonics Symposium (IUS), 2017, Washington

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: http://dx.doi.org/10.1109/ULTSYM.2017.8092587

 

BCB polymer based row-column addressed CMUT

Havreland, Andreas Spandet ; Ommen, Martin Lind ; Silvestre, Chantal ; Engholm, Mathias ; Jensen, Jørgen Arendt ; Thomsen, Erik Vilain
part of: Proceedings of the 2017 IEEE International Ultrasonics Symposium (ISBN: 9781538633823), 2017, IEEE,
Presented at:
2017 IEEE International Ultrasonics Symposium (IUS), 2017, Washington

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: http://dx.doi.org/10.1109/ULTSYM.2017.8091939

  PDF

Combined Colorimetric and Gravimetric CMUT Sensor for Detection of Phenylacetone

Mølgaard, Mathias Johannes Grøndahl ; Laustsen, Milan ; Thygesen, Ida Lysgaard ; Jakobsen, Mogens Havsteen ; Andresen, Thomas Lars ; Thomsen, Erik Vilain
part of: 2017 IEEE International Ultrasonics Symposium (IUS), 2017, IEEE,
Presented at:
2017 IEEE International Ultrasonics Symposium (IUS), 2017, Washington

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: http://dx.doi.org/10.1109/ULTSYM.2017.8091676

  PDF

Output Pressure and Pulse-Echo Characteristics of CMUTs as Function of Plate Dimensions

Diederichsen, Søren Elmin ; Hansen, Jesper Mark Fly ; Engholm, Mathias ; Jensen, Jørgen Arendt ; Thomsen, Erik Vilain
part of: 2017 IEEE International Ultrasonics Symposium (IUS), 2017, IEEE,
Presented at:
2017 IEEE International Ultrasonics Symposium (IUS), 2017, Washington

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: http://dx.doi.org/10.1109/ULTSYM.2017.8092352

  PDF

Simulating CMUT Arrays Using Time Domain FEA

Engholm, Mathias ; Tweedie, Andrew ; Jensen, Jonas ; Harvey, Gerald ; Diederichsen, Søren Elmin ; Jensen, Jørgen Arendt ; Thomsen, Erik Vilain
part of: 2017 IEEE International Ultrasonics Symposium (IUS), 2017, IEEE,
Presented at:
2017 IEEE International Ultrasonics Symposium (IUS), 2017, Washington

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: http://dx.doi.org/10.1109/ULTSYM.2017.8092395

  PDF

3-D Imaging using Row–Column-Addressed 2-D Arrays with a Diverging Lens: Phantom Study

Bouzari, Hamed ; Engholm, Mathias ; Beers, Christopher ; Stuart, Matthias Bo ; Nikolov, Svetoslav Ivanov ; Thomsen, Erik Vilain ; Jensen, Jørgen Arendt
part of: 2017 IEEE International Ultrasonics Symposium (IUS), 2017, IEEE,
Presented at:
2017 IEEE International Ultrasonics Symposium (IUS), 2017, Washington

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: http://dx.doi.org/10.1109/ULTSYM.2017.8092496