Henning Friis Poulsen

Henning Friis Poulsen

Professor

DTU PHYSICS
Department of Physics

Technical University of Denmark

Fysikvej

Building 307, room 246

2800 Kgs. Lyngby

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2018
 

A spectral geometric model for Compton single scatter in PET based on the single scatter simulation approximation

Kazantsev, I.G. ; Olsen, Ulrik Lund ; Poulsen, Henning Friis ; Hansen, Per Christian
in: Inverse Problems (ISSN: 0266-5611), vol: 34, issue: 2, 2018

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2018     |    DOI: http://dx.doi.org/10.1088/1361-6420/aaa05d

  PDF

The fractional Fourier transform as a simulation tool for lens-based X-ray microscopy

Pedersen, Anders Filsøe ; Simons, Hugh ; Detlefs, Carsten ; Poulsen, Henning Friis
in: Journal of Synchrotron Radiation (ISSN: 0909-0495), vol: 25, issue: 3, 2018

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2018     |    DOI: http://dx.doi.org/10.1107/S1600577518003028

2017
  PDF

HIGH PRECISION COMPUTED TOMOGRAPHY FOR METROLOGY

Gundlach, Carsten (Inventor) ; Poulsen, Henning Friis (Inventor)
Patent no.: WO2017186804, Date: 02-11-2017

Type: Patent

Status: Published     |    Year: 2017

  PDF

Determining material parameters using phase-field simulations and experiments

Zhang, Jin ; Poulsen, Stefan O. ; Gibbs, John W. ; Voorhees, Peter W. ; Poulsen, Henning Friis
in: Acta Materialia (ISSN: 1359-6454), vol: 129, pages: 229-238, 2017

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: http://dx.doi.org/10.1016/j.actamat.2017.02.056

  PDF

Simulating and optimizing compound refractive lens-based X-ray microscopes

Simons, Hugh ; Ahl, Sonja Rosenlund ; Poulsen, Henning Friis ; Detlefs, Carsten
in: Journal of Synchrotron Radiation (ISSN: 0909-0495), vol: 24, issue: 2, pages: 392-401, 2017

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: http://dx.doi.org/10.1107/S160057751602049X

 

Ultra-low-angle boundary networks within recrystallizing grains

Ahl, Sonja Rosenlund ; Simons, Hugh ; Zhang, Yubin ; Detlefs, C. ; Stöhr, Frederik ; Jakobsen, Anders Clemen ; Juul Jensen, Dorte ; Poulsen, Henning Friis
in: Scripta Materialia (ISSN: 1359-6462), vol: 139, pages: 87-91, 2017

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: http://dx.doi.org/10.1016/j.scriptamat.2017.06.016

  PDF

X-ray diffraction microscopy based on refractive optics

Poulsen, Henning Friis ; Jakobsen, Anders Clemen ; Simons, Hugh ; Ahl, Sonja Rosenlund ; Cook, P. K. ; Detlefs, C.
in: Journal of Applied Crystallography (ISSN: 0021-8898), vol: 50, issue: 5, pages: 1441-1456, 2017

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: http://dx.doi.org/10.1107/S1600576717011037

  PDF

In operando studies of an yttria stabilized zirconia electrolyte supported symmetric solid oxide cell by Dark field X-ray Microscopy at ID06

Sierra Trujillo, Jose Xavier ; Jørgensen, Peter Stanley ; Poulsen, Henning Friis ; Detlefs, C. ; Cook, P. ; Simons, Hugh ; Bowen, Jacob R.
Presented at:
ESRF User Meeting 2017, 2017, Grenoble

Type: Conference abstract for conference

Status: Published     |    Year: 2017