DTU Fysik
DTU Nanotech
Dirch Hjorth Petersen

Dirch Hjorth Petersen

Seniorforsker

Institut for Fysik

Danmarks Tekniske Universitet

Ørsteds Plads

Bygning 345B, rum 249

2800 Kgs. Lyngby

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2018
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A variable probe pitch micro-Hall effect method

Witthøft, Maria-Louise ; Østerberg, Frederik W. ; Bogdanowicz, Janusz ; Lin, Rong ; Henrichsen, Henrik H. ; Hansen, Ole ; Petersen, Dirch Hjorth
in: Beilstein Journal of Nanotechnology, vol: 9, pages: 2032-2039

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2018     |    DOI: https://doi.org/10.3762/bjnano.9.192

 

Black silicon with tunnel oxide passivated contacts

Kloster, Maren E. ; Witthøft, Maria-Louise ; Shearer, Denver C. ; Hajijafarassar, Alireza ; Davidsen, Rasmus S. ; Petersen, Dirch H. ; Hansen, Ole ; Iandolo, Beniamino
part of: Proceedings of the 35th EU PVSEC 2018, pages: 668-671, 2018
Presented at:
35th European Photovoltaic Solar Energy Conference and Exhibition

Type: Article in proceedings (Peer reviewed)

Status: Published     |    År: 2018

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Electrical characterization of single nanometer-wide Si fins in dense arrays

Folkersma, Steven ; Bogdanowicz, Janusz ; Schulze, Andreas ; Favia, Paola ; Petersen, Dirch H. ; Hansen, Ole ; Henrichsen, Henrik H. ; Nielsen, Peter F. ; Shiv, Lior ; Vandervorst, Wilfried
in: Beilstein Journal of Nanotechnology, vol: 9, pages: 1853-1857

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2018     |    DOI: https://doi.org/10.3762/bjnano.9.178

 

Electrical Homogeneity Mapping of Epitaxial Graphene on Silicon Carbide

Whelan, Patrick Rebsdorf ; Panchal, Vishal ; Petersen, Dirch Hjorth ; Mackenzie, David M. A. ; Melios, Christos ; Pasternak, Iwona ; Gallop, John ; Østerberg, Frederik Westergaard ; Jepsen, Peter Uhd ; Strupinski, Wlodek ; Kazakova, Olga ; Bøggild, Peter
in: A C S Applied Materials and Interfaces, vol: 10, issue: 37

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2018     |    DOI: https://doi.org/10.1021/acsami.8b11428

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Hall effect measurement for precise sheet resistance and thickness evaluation of Ruthenium thin films using non-equidistant four-point probes

Østerberg, Frederik Westergaard ; Witthøft, Maria-Louise ; Dutta, Shibesh ; Meersschaut, Johan ; Adelmann, Christoph ; Nielsen, Peter Folmer ; Hansen, Ole ; Petersen, Dirch Hjorth
in: A I P Advances, vol: 8, issue: 5

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2018     |    DOI: https://doi.org/10.1063/1.5010399

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Mobility and Carrier Concentration Measurements on nm-Wide Semiconductor Fins

Witthøft, M.-L. ; Folkersma, S. ; Bogdanowicz, J. ; Marangoni, T. ; Mackenzie, D. ; Vohra, A. ; Porret, C. ; Loo, R. ; Henrichsen, H. H. ; Hansen, O. ; Vandervorst, W. ; Petersen, D.H.
Presented at:
2018 E-MRS Spring Meeting and Exhibit

Type: Conference abstract for conference (Peer reviewed)

Status: Published     |    År: 2018

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Quality assessment of terahertz time-domain spectroscopy transmission and reflection modes for graphene conductivity mapping

Mackenzie, David M.A. ; Whelan, Patrick Rebsdorf ; Bøggild, Peter ; Jepsen, Peter Uhd ; Redo-Sanchez, Albert ; Etayo, David ; Fabricius, Norbert ; Petersen, Dirch Hjorth
in: Optics Express, vol: 26, issue: 7, pages: 9220-9229

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2018     |    DOI: https://doi.org/10.1364/OE.26.009220

 

Thermally Aided Nonvolatile Memory Using ReS2 Transistors

Goyal, Natasha ; Mackenzie, David M. A. ; Jawa, Himani ; Petersen, Dirch H. ; Lodha, Saurabh
part of: Proceedings of 2018 76th Device Research Conference (DRC), 2018, IEEE
Presented at:
76th Device Research Conference

Type: Article in proceedings (Peer reviewed)

Status: Published     |    År: 2018     |    DOI: https://doi.org/10.1109/DRC.2018.8442168

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Vibration tolerance of micro-electrodes

Kalhauge, Kristoffer Gram ; Henrichsen, Henrik Hartmann ; Wang, Fei ; Hansen, Ole ; Petersen, Dirch Hjorth
in: Journal of Micromechanics and Microengineering, vol: 28, issue: 9

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2018     |    DOI: https://doi.org/10.1088/1361-6439/aac58e

 

Width-Dependent Sheet Resistance of Nanometer-Wide Si Fins as Measured with Micro Four-Point Probe

Bogdanowicz, Janusz ; Folkersma, Steven ; Sergeant, Stefanie ; Schulze, Andreas ; Moussa, Alain ; Petersen, Dirch Hjorth ; Hansen, Ole ; Henrichsen, Henrik Hartmann ; Nielsen, Peter Folmer ; Vandervorst, Wilfried
in: Physica Status Solidi. A: Applications and Materials Science (Online), vol: 215, issue: 6

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2018     |    DOI: https://doi.org/10.1002/pssa.201700857