Marco Beleggia

Marco Beleggia

Lektor

DTU CEN
Center for Elektronnanoskopi

Danmarks Tekniske Universitet

Fysikvej

Bygning 307, rum 120

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2018
 

Charging of carbon thin films in scanning and phase-plate transmission electron microscopy

Hettler, Simon ; Kano, Emi ; Dries, Manuel ; Gerthsen, Dagmar ; Pfaffmann, Lukas ; Bruns, Michael ; Beleggia, Marco ; Malac, Marek
in journal: Ultramicroscopy (ISSN: 0304-3991) (DOI: http://dx.doi.org/10.1016/j.ultramic.2017.09.009), vol: 184, pages: 252-266, 2018

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2018     |    DOI: http://dx.doi.org/10.1016/j.ultramic.2017.09.009

2017
  PDF

A METHOD FOR CREATING STRUCTURES OR DEVICES USING AN ORGANIC ICE RESIST

Han, Anpan (Inventor) ; Tiddi, William (Inventor) ; Beleggia, Marco (Inventor)
Patent no.: WO2017191079, Date: 09-11-2017

Type: Patent

Status: Published     |    År: 2017

  PDF

The substrate effect in electron energy-loss spectroscopy of localized surface plasmons in gold and silver nanoparticles

Kadkhodazadeh, Shima ; Christensen, Thomas ; Beleggia, Marco ; Mortensen, N. Asger ; Wagner, Jakob Birkedal
in journal: ACS Photonics (ISSN: 2330-4022) (DOI: http://dx.doi.org/10.1021/acsphotonics.6b00489), vol: 4, issue: 2, pages: 251-261, 2017

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2017     |    DOI: http://dx.doi.org/10.1021/acsphotonics.6b00489

 

Computer simulations analysis for determining the polarity of charge generated by high energy electron irradiation of a thin film

Malac, Marek ; Hettler, Simon ; Hayashida, Misa ; Kawasaki, Masahiro ; Konyuba, Yuji ; Okura, Yoshi ; Iijima, Hirofumi ; Ishikawa, Isamu ; Beleggia, Marco
in journal: Micron (ISSN: 0968-4328) (DOI: http://dx.doi.org/10.1016/j.micron.2017.03.015), vol: 100, pages: 10-22, 2017

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2017     |    DOI: http://dx.doi.org/10.1016/j.micron.2017.03.015

 

Magnetic dipolar ordering and hysteresis of geometrically defined nanoparticle clusters

Kure, Mathias ; Beleggia, Marco ; Frandsen, Cathrine
in journal: Journal of Applied Physics (ISSN: 0021-8979) (DOI: http://dx.doi.org/10.1063/1.4994002), vol: 122, issue: 13, 2017

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2017     |    DOI: http://dx.doi.org/10.1063/1.4994002

  PDF

In Situ Transmission Electron Microscopy in Materials Science - Possibilities and Prospects

Wagner, Jakob Birkedal ; Zhang, Lili ; Gualandris, Fabrizio ; Simonsen, Søren Bredmose ; Kuhn, Luise Theil ; Beleggia, Marco ; Hansen, Thomas Willum
Presented at:
International Conference on Materials and Systems for Sustainability 2017, 2017, Nagoya

Type: Conference abstract for conference (Peer reviewed)

Status: Published     |    År: 2017

 

Organic ice resists

Tiddi, William ; Elsukova, Anna ; Lê Thanh, Hoà ; Liu, Pei ; Beleggia, Marco ; Han, Anpan
in journal: Nano Letters (ISSN: 1530-6984) (DOI: http://dx.doi.org/10.1021/acs.nanolett.7b04190), vol: 17, issue: 12, pages: 7886−7891, 2017

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2017     |    DOI: http://dx.doi.org/10.1021/acs.nanolett.7b04190

  PDF

Organic ice resists: condensed small molecules as spin-free volatile E-beam resists

Tiddi, William ; Lê Thanh, Hoà ; Elsukova, Anna ; Beleggia, Marco ; Han, Anpan
Presented at:
43rd International conference on Micro and Nano Engineering, 2017, Braga

Type: Conference abstract for conference (Peer reviewed)

Status: Published     |    År: 2017

2016
  PDF

Local charge measurement using off-axis electron holography

Beleggia, Marco ; Gontard, L.C. ; Dunin-Borkowski, R.0E.
in journal: Journal of Physics D: Applied Physics (ISSN: 0022-3727) (DOI: http://dx.doi.org/10.1088/0022-3727/49/29/294003), vol: 49, issue: 29, 2016

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2016     |    DOI: http://dx.doi.org/10.1088/0022-3727/49/29/294003

 

Gas–Electron Interaction in the ETEM

Wagner, Jakob Birkedal ; Beleggia, Marco
part of: Controlled Atmosphere Transmission Electron Microscopy (ISBN: 978-3-319-22987-4), pages: 63-94, 2016, Springer,

Type: Book chapter (Peer reviewed)

Status: Published     |    År: 2016     |    DOI: http://dx.doi.org/10.1007/978-3-319-22988-1_3