Ole Hansen

Ole Hansen

Professor

DTU NANOTECH
Institut for Mikro- og Nanoteknologi

Danmarks Tekniske Universitet

Ørsteds Plads

Bygning 344, rum 032

2800 Kgs. Lyngby

Tlf.
Fax 45 88 77 62
E-mail ole.hansen@nanotech.dtu.dk
ORCID 0000-0002-6090-8323

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2018
 

Width-Dependent Sheet Resistance of Nanometer-Wide Si Fins as Measured with Micro Four-Point Probe

Bogdanowicz, Janusz ; Folkersma, Steven ; Sergeant, Stefanie ; Schulze, Andreas ; Moussa, Alain ; Petersen, Dirch Hjorth ; Hansen, Ole ; Henrichsen, Henrik Hartmann ; Nielsen, Peter Folmer ; Vandervorst, Wilfried
in: Physica Status Solidi. A: Applications and Materials Science (Online) (ISSN: 1862-6319), vol: 215, 2018

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2018     |    DOI: http://dx.doi.org/10.1002/pssa.201700857

  PDF

Low temperature bonding of heterogeneous materials using Al2O3 as an intermediate layer

Sahoo, Hitesh Kumar ; Ottaviano, Luisa ; Zheng, Yi ; Hansen, Ole ; Yvind, Kresten
in: Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures (ISSN: 1071-1023), vol: 36, issue: 1, 2018

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2018     |    DOI: http://dx.doi.org/10.1116/1.5005591

 

Enabling real-time detection of electrochemical desorption phenomena with sub-monolayer sensitivity

Trimarco, Daniel Bøndergaard ; Scott, Søren Bertelsen ; Thilsted, Anil Haraksingh ; Pan, Jesper Yue ; Pedersen, Thomas ; Hansen, Ole ; Chorkendorff, Ib ; Vesborg, Peter Christian Kjærgaard
in: Electrochimica Acta (ISSN: 0013-4686), vol: 268, pages: 520-530, 2018

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2018     |    DOI: http://dx.doi.org/10.1016/j.electacta.2018.02.060

  PDF

Wavelength tunable MEMS VCSELs for OCT imaging

Sahoo, Hitesh Kumar ; Ansbæk, Thor ; Ottaviano, Luisa ; Semenova, Elizaveta ; Hansen, Ole ; Yvind, Kresten
part of: Proceedings of SPIE (ISBN: 9781510615892), 2018, SPIE - International Society for Optical Engineering,
Presented at:
Vertical-Cavity Surface-Emitting Lasers XXII, 2018, San Francisco

Type: Article in proceedings (Peer reviewed)

Status: Published     |    År: 2018     |    DOI: http://dx.doi.org/10.1117/12.2289545

  PDF

Hall effect measurement for precise sheet resistance and thickness evaluation of Ruthenium thin films using non-equidistant four-point probes

Østerberg, Frederik Westergaard ; Witthøft, Maria-Louise ; Dutta, Shibesh ; Meersschaut, Johan ; Adelmann, Christoph ; Nielsen, Peter Folmer ; Hansen, Ole ; Petersen, Dirch Hjorth
in: A I P Advances (ISSN: 2158-3226), vol: 8, issue: 5, 2018

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2018     |    DOI: http://dx.doi.org/10.1063/1.5010399

  PDF

Low temperature bonding of heterogeneous materials using Al2O3 as an intermediate layer

Sahoo, Hitesh Kumar ; Ottaviano, Luisa ; Zheng, Yi ; Hansen, Ole ; Yvind, Kresten
part of: Proceedings of SPIE (ISBN: 9781510615557), 2018, SPIE - International Society for Optical Engineering,
Presented at:
Integrated Optics: Devices, Materials, and Technologies XXII, 2018, San Francisco

Type: Article in proceedings (Peer reviewed)

Status: Published     |    År: 2018     |    DOI: http://dx.doi.org/10.1117/12.2289526

  PDF

Vibration tolerance of micro-electrodes

Kalhauge, Kristoffer Gram ; Henrichsen, Henrik Hartmann ; Wang, Fei ; Hansen, Ole ; Petersen, Dirch Hjorth
in: Journal of Micromechanics and Microengineering (ISSN: 0960-1317), vol: 28, issue: 9, 2018

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2018     |    DOI: http://dx.doi.org/10.1088/1361-6439/aac58e

  PDF

Photoluminescence Imaging Induced by Laser Line Scan: Study for Outdoor Field Inspections

Benatto, Gisele Alves dos Reis ; Chi, Mingjin ; Jensen, Ole Bjarlin ; Santamaria Lancia, Adrian Alejo ; Riedel, Nicholas ; Iandolo, Beniamino ; Davidsen, Rasmus Schmidt ; Hansen, Ole ; Thorsteinsson, Sune ; Poulsen, Peter Behrensdorff
part of: Proceedings of 7th World Conference on Photovoltaic Energy Conversion, 2018, IEEE,
Presented at:
7th World Conference on Photovoltaic Energy Conversion , 2018, Waikoloa

Type: Article in proceedings (Peer reviewed)

Status: Published     |    År: 2018

  PDF

Electrical characterization of single nanometer-wide Si fins in dense arrays

Folkersma, Steven ; Bogdanowicz, Janusz ; Schulze, Andreas ; Favia, Paola ; Petersen, Dirch Hjorth ; Hansen, Ole ; Henrichsen, Henrik H. ; Nielsen, Peter F. ; Shiv, Lior ; Vandervorst, Wilfried
in: Beilstein Journal of Nanotechnology (ISSN: 2190-4286), vol: 9, pages: 1853-1857, 2018

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2018     |    DOI: http://dx.doi.org/10.3762/bjnano.9.178

  PDF

Mobility and Carrier Concentration Measurements on nm-Wide Semiconductor Fins

Witthøft, Maria-Louise ; Folkersma, S. ; Bogdanowicz, J. ; Marangoni, Thomas ; Mackenzie, David ; Vohra, A. ; Porret, C. ; Loo, R. ; Henrichsen, H. H. ; Hansen, Ole ; Vandervorst, W. ; Petersen, Dirch Hjorth
Presented at:
2018 E-MRS Spring Meeting and Exhibit, 2018, Strasbourg

Type: Conference abstract for conference (Peer reviewed)

Status: Published     |    År: 2018