Leonardo De Chiffre

Leonardo De Chiffre

Professor

DTU MECHANICAL ENGINEERING
Department of Mechanical Engineering

Section of Manufacturing Engineering

Technical University of Denmark

Produktionstorvet

Building 425, room 206

2800 Kgs. Lyngby

Ph.
Fax +4545 25 19 61
E-mail ldch@mek.dtu.dk
ORCID 0000-0002-6141-9580
Home page

Request a vCard via e-mail.

Publications
Projects
Courses
DTU news
Loading

Publications rss feed

2019
 

Development and metrological validation of a new automated scanner system for freeform measurements on wind turbine blades in the production

Lyngby, Rasmus Ahrenkiel ; Nielsen, Ewa ; De Chiffre, Leonardo ; Aanæs, Henrik ; Dahl, Anders Bjorholm
in: Precision Engineering, vol: 56, pages: 255-266

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2019     |    DOI: https://doi.org/10.1016/j.precisioneng.2018.12.006

  PDF

Roughness Investigation of SLM Manufactured Conformal Cooling Channels Using X-ray Computed Tomography

Klingaa, Christopher G. ; Bjerre, Mathias K. ; Baier, Sina ; De Chiffre, Leonardo ; Mohanty, Sankhya ; Hattel, Jesper H.
part of: Proceedings of the 9th Conference on Industrial Computed Tomography, Padova, Italy (iCT 2019), 2019
Presented at:
9th Conference on Industrial Computed Tomography (ICT2019)

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2019

  PDF

Thermal characterization of a micro polishing machine and effect on path strategy compensation

Ben Achour, Soufian ; Checchi, Alessandro ; Bissacco, Giuliano ; De Chiffre, Leonardo
part of: Proceedings of the 19th International Conference and Exhibition (EUSPEN 2019), pages: 446-447, 2019, The European Society for Precision Engineering and Nanotechnology
Presented at:
euspen's 19th International Conference & Exhibition

Type: Conference abstract in proceedings (Peer reviewed)

Status: Published     |    Year: 2019

2018
  PDF

Accurate measurements in a production environment using dynamic length metrology (DLM)

Chiffre, L. De ; González-Madruga, D. ; Costa, G. Dalla ; Sonne, M.R. ; Mohammadi, A. ; Hattel, J.H. ; Hansen, H.N. ; Mohaghegh, K. ; Meftahpour, M. ; Meinertz, J. ; Meinertz, C.
in: Procedia CIRP, vol: 75, pages: 343-348
Presented at:
15th CIRP Conference on Computer Aided Tolerancing (CIRP CAT 2018)

Type: Conference article (Peer reviewed)

Status: Published     |    Year: 2018     |    DOI: https://doi.org/10.1016/j.procir.2018.04.074

  PDF

Applicability of Acoustic Emission monitoring to micro polishing

Ben Achour, Soufian ; Bissacco, Giuliano ; De Chiffre, L.
part of: Proceedings of the 18th International Conference of the European Society for Precision Engineering and Nanotechnology, pages: 385-386, 2018, The European Society for Precision Engineering and Nanotechnology
Presented at:
18th International Conference of the european Society for Precision Engineering and Nanotechnology (euspen 18)

Type: Conference abstract in proceedings (Peer reviewed)

Status: Published     |    Year: 2018

 

A simple model linking surface roughness with friction coefficient and manufacturing cost

De Chiffre, L. ; Kücükyildiz, Ô. C. ; Bay, N.
in: Key Engineering Materials, vol: 767 , pages: 275-282

Type: Conference article (Peer reviewed)

Status: Published     |    Year: 2018     |    DOI: https://doi.org/10.4028/www.scientific.net/KEM.767.275

  PDF

Automated contact area measurement on structured surfaces

Kücükyildiz, Ömer C. ; Jensen, Sebastian H. N. ; De Chiffre, Leonardo
part of: Proceedings of the 18th International Conference of the European Society for Precision Engineering and Nanotechnology, pages: 473-474 , 2018, The European Society for Precision Engineering and Nanotechnology
Presented at:
18th International Conference of the european Society for Precision Engineering and Nanotechnology (euspen 18)

Type: Conference abstract in proceedings (Peer reviewed)

Status: Published     |    Year: 2018

  PDF

Characterization of holding brake friction pad surface after pin-on-plate wear test

Drago, N. ; Gonzalez Madruga, D. ; De Chiffre, L.
in: Surface Topography: Metrology and Properties, vol: 6, issue: 1

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2018     |    DOI: https://doi.org/10.1088/2051-672X/aaabd3

  PDF

Compensation of in-line metrology of polymer parts based on 3D thermomechanical analyses

Sonne, M.R. ; Costa, G. Dalla ; Madruga, D.G. ; Chiffre, L. De ; Hattel, J.H.
in: Procedia CIRP, vol: 75, pages: 349-354
Presented at:
15th CIRP Conference on Computer Aided Tolerancing (CIRP CAT 2018)

Type: Conference article (Peer reviewed)

Status: Published     |    Year: 2018     |    DOI: https://doi.org/10.1016/j.procir.2018.04.083

  PDF

Considerations on numerical modelling for compensation of in-process metrology in manufacturing

Sonne, M. R. ; Mohammadi, A. ; Dalla Costa, G. ; Madruga, D. G. ; De Chiffre, L. ; Hattel, J. H.
part of: Proceedings of the 18th International Conference of the european Society for Precision Engineering and Nanotechnology , pages: 453-454 , 2018, The European Society for Precision Engineering and Nanotechnology
Presented at:
18th International Conference of the european Society for Precision Engineering and Nanotechnology (euspen 18)

Type: Conference abstract in proceedings (Peer reviewed)

Status: Published     |    Year: 2018

 

Effects of subsurface scattering on the accuracy of optical 3D measurements using miniature polymer step gauges

Wilm, Jakob ; Madruga, Daniel González ; Jensen, Janus Nørtoft ; Gregersen, Søren Kimmer Schou ; Doest, Mads Emil Brix ; Guerra, Maria Grazia ; Aanæs, Henrik ; De Chiffre, Leonardo
part of: Proceedings of the 18th International Conference of the European Society for Precision Engineering and Nanotechnology, pages: 449-450, 2018, The European Society for Precision Engineering and Nanotechnology
Presented at:
18th International Conference of the european Society for Precision Engineering and Nanotechnology (euspen 18)

Type: Conference abstract in proceedings (Peer reviewed)

Status: Published     |    Year: 2018

 

Error sources

Stolfi, Alessandro ; De Chiffre, Leonardo ; Kasperl, Stefan
part of: Industrial X-Ray Computed Tomography, pages: 143-184, 2018, Springer

Type: Book chapter (Peer reviewed)

Status: Published     |    Year: 2018     |    DOI: https://doi.org/10.1007/978-3-319-59573-3_5

  PDF

Interlaboratory Comparison of a physical and a virtual assembly measured by CT

Stolfi, Alessandro ; De Chiffre, Leonardo
in: Precision Engineering, vol: 51, pages: 263-270

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2018     |    DOI: https://doi.org/10.1016/j.precisioneng.2017.08.018

  PDF

Post moulding thermal characterization of polymer components

D. Costa, G. ; González-Madruga, D. ; De Chiffre, L.
part of: Proceedings of the 18th International Conference of the European Society for Precision Engineering and Nanotechnology, pages: 469-470 , 2018, The European Society for Precision Engineering and Nanotechnology
Presented at:
18th International Conference of the european Society for Precision Engineering and Nanotechnology (euspen 18)

Type: Conference abstract in proceedings (Peer reviewed)

Status: Published     |    Year: 2018

 

Predicting the reference length of polymer parts with micrometer uncertainty measured under non-reference conditions

Mohammadi, A. ; Sonne, M. R. ; Dalla Costa, G. ; González-Madruga, D. ; De Chiffre, L. ; Hattel, J. H.
in: Precision Engineering, vol: 54, pages: 344-352

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2018     |    DOI: https://doi.org/10.1016/j.precisioneng.2018.07.003

2017
  PDF

GEOMETRICAL CALIBRATION OF X-RAY CT SCANNERS

Stolfi, Alessandro ; De Chiffre, Leonardo
Patent no.: EP3195802, Date: 2017-07-26

Type: Patent

Status: Published     |    Year: 2017

 

Characterisation and full-scale production testing of multifunctional surfaces for deep drawing applications

Godi, Alessandro ; Grønbæk, J. ; De Chiffre, Leonardo
in: C I R P - Journal of Manufacturing Science and Technology, vol: 16, pages: 64–71

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: https://doi.org/10.1016/j.cirpj.2016.07.001

  PDF

Characterizing Green Fiber Bottle Prototypes Using Computed Tomography

Saxena, Prateek ; Bissacco, Giuliano ; Stolfi, Alessandro ; De Chiffre, Leonardo
part of: Proceedings of the 7th Conference on Industrial Computed Tomography (iCT 2017), 2017
Presented at:
7th Conference on Industrial Computed Tomography (iCT 2017)

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2017

  PDF

Material testing of copper by extrusion-cutting

Segalina, F. ; De Chiffre, Leonardo
in: Procedia CIRP, vol: 58, pages: 375-380
Presented at:
16th CIRP Conference on Modelling of Machining Operations

Type: Conference article (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: https://doi.org/10.1016/j.procir.2017.03.240

 

Monitoring of the thermal deformations on polymer parts using a vision system

Dalla Costa, Giuseppe ; Madruga, Daniel González ; De Chiffre, Leonardo
part of: Proceedings of the 17th International Conference of the European Society for Precision Engineering and Nanotechnology, 2017, The European Society for Precision Engineering and Nanotechnology
Presented at:
euspen’s 17th International Conference & Exhibition

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2017

  PDF

Traceability investigation in Computed Tomography using industry-inspired workpieces

Kraemer, Alexandra ; Stolfi, Alessandro ; Schneider, Timm ; De Chiffre, Leonardo ; Lanza, Gisela
part of: Proceedings of the 7th Conference on Industrial Computed Tomography (iCT 2017), 2017
Presented at:
7th Conference on Industrial Computed Tomography (iCT 2017)

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2017

2016
 

3D artefact for concurrent scale calibration in Computed Tomography

Stolfi, Alessandro ; De Chiffre, Leonardo
in: C I R P Annals, vol: 65, issue: 1, pages: 499-502

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2016     |    DOI: https://doi.org/10.1016/j.cirp.2016.04.069

  PDF

Accuracy assessment of an industrial actuator

Dalla Costa, Giuseppe ; Genta, Gianfranco ; Barbato, Giulio ; De Chiffre, Leonardo ; Hansen, Hans Nørgaard
in: Procedia C I R P, vol: 62, pages: 417-422
Presented at:
10th CIRP Conference on Intelligent Computation in Manufacturing Engineering (CIRP ICME '16)

Type: Conference article (Peer reviewed)

Status: Published     |    Year: 2016     |    DOI: https://doi.org/10.1016/j.procir.2016.06.119

  PDF

Accuracy Enhancement of CT Measurements using Data Filtering

Stolfi, Alessandro ; Kallasse, Maarja-Helena ; Carli, Lorenzo ; De Chiffre, Leonardo
part of: Proceedings of the 6th Conference on Industrial Computed Tomography (iCT 2016), 2016
Presented at:
6th Conference on Industrial Computed Tomography

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2016

 

Acoustic emission-based in-process monitoring of surface generation in robot-assisted polishing

Pilny, Lukas ; Bissacco, Giuliano ; De Chiffre, Leonardo ; Ramsing, Jes
in: International Journal of Computer Integrated Manufacturing, vol: 29, issue: 11, pages: 1218-1226

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2016     |    DOI: https://doi.org/10.1080/0951192X.2015.1034180

  PDF

Calibration of surface roughness standards

Thalmann, R. ; Nicolet, A. ; Meli, F. ; Picotto, G. B. ; Matus, M. ; Carcedo, L. ; Hemming, B. ; Ganioglu, O. ; De Chiffre, Leonardo ; Saraiva, F. ; Bergstrand, S. ; Zelenika, S. ; Tonmueanwai, A. ; Tsai, C.S. ; Shihua, W. ; Kruger, O. ; de Souza, M. M. ; Salgado, J. A. ; Ramotowski, Z.
in: Metrologia, vol: 53, issue: 1A

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2016     |    DOI: https://doi.org/10.1088/0026-1394/53/1A/04001

  PDF

Contact area measurements on structured surfaces

Kücükyildiz, Ömer Can ; Jensen, Sebastian Hoppe Nesgaard ; De Chiffre, Leonardo
Presented at:
Euspen's S.I.G. Meeting

Type: Poster (Peer reviewed)

Status: Published     |    Year: 2016

 

CT crown for on-machine scale calibration in Computed Tomography

Stolfi, Alessandro ; De Chiffre, Leonardo
part of: Proceedings of euspen’s 16th International Conference & Exhibition, 2016
Presented at:
euspen’s 16th International Conference & Exhibition

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2016

 

Dynamic Length Metrology (DLM) for measurements with sub-micrometre uncertainty in a production environment

De Chiffre, Leonardo ; Hansen, Hans Nørgaard ; Hattel, Jesper Henri ; Madruga, Daniel González ; Dalla Costa, Giuseppe ; Sonne, Mads Rostgaard ; Mohammadi, Ali
part of: Proceedings of euspen’s 16th International Conference & Exhibition, 2016
Presented at:
euspen’s 16th International Conference & Exhibition

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2016

 

Economic benefits of metrology in manufacturing

Savio, Enrico ; De Chiffre, Leonardo ; Carmignato, S. ; Meinertz, J.
in: C I R P Annals, vol: 65, issue: 1, pages: 495-498

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2016     |    DOI: https://doi.org/10.1016/j.cirp.2016.04.020

  PDF

Environmentally clean micromilling of electron beam melted Ti6Al4V

Bruschi, S. ; Tristo, G. ; Rysava, Z. ; Bariani, P. P. ; Umbrello, D. ; De Chiffre, Leonardo
in: Journal of Cleaner Production, vol: 133, pages: 932-941

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2016     |    DOI: https://doi.org/10.1016/j.jclepro.2016.06.035

  PDF

Experimental investigation of surface determination process on multi-material components for dimensional computed tomography

Borges de Oliveira, Fabrício ; Stolfi, Alessandro ; Bartscher, Markus ; De Chiffre, Leonardo
in: Case Studies in Nondestructive Testing and Evaluation, vol: 6, issue: Part B, pages: 93–103

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2016     |    DOI: https://doi.org/10.1016/j.csndt.2016.04.003

  PDF

InteraqCT Comparison on Assemblies - Final Report

Stolfi, Alessandro ; De Chiffre, Leonardo

Type: Report

Status: Published     |    Year: 2016

 
 

Length determination on industrial polymer parts from measurement performed under transient temperature conditions

Dalla Costa, Giuseppe ; Madruga, Daniel González ; De Chiffre, Leonardo ; Hansen, Hans Nørgaard
part of: Proceedings of euspen’s 16th International Conference & Exhibition, 2016
Presented at:
euspen’s 16th International Conference & Exhibition

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2016

 

Modeling the effect of probe force on length measurements on polymer parts

Mohammadi, Ali ; Sonne, Mads Rostgaard ; Dalla Costa, Giuseppe ; Madruga, Daniel González ; De Chiffre, Leonardo ; Hattel, Jesper Henri
part of: Proceedings of euspen’s 16th International Conference & Exhibition, 2016
Presented at:
euspen’s 16th International Conference & Exhibition

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2016

  PDF

Quantifying the Contribution of Post-Processing in Computed Tomography Measurement Uncertainty

Stolfi, Alessandro ; Thompson, Mary Kathryn ; Carli, Lorenzo ; De Chiffre, Leonardo
in: Procedia C I R P, vol: 43, pages: 297–302
Presented at:
14th CIRP Conference on Computer Aided Tolerancing

Type: Conference article (Peer reviewed)

Status: Published     |    Year: 2016     |    DOI: https://doi.org/10.1016/j.procir.2016.02.123

  PDF

Selection of items for “InteraqCT Comparison on Assemblies”

Stolfi, Alessandro ; De Chiffre, Leonardo
part of: Proceedings of the 6th Conference on Industrial Computed Tomography (iCT 2016), 2016
Presented at:
6th Conference on Industrial Computed Tomography

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2016

 

Step-height measurements on sand surfaces: A comparison between optical scanner and coordinate measuring machine

Mohaghegh, Kamran ; Yazdanbakhsh, Seyed Alireza ; Tiedje, Niels Skat ; De Chiffre, Leonardo
part of: Proceedings of euspen’s 16th International Conference & Exhibition,, 2016
Presented at:
euspen’s 16th International Conference & Exhibition

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2016

 

The influence of humidity on accuracy length measurement on polymer parts

Madruga, Daniel González ; Alexiou, A. ; Dalla Costa, Giuseppe ; De Chiffre, Leonardo ; Neves, L. C.
part of: Proceedings of euspen’s 16th International Conference & Exhibition, 2016
Presented at:
euspen’s 16th International Conference & Exhibition

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2016

  PDF

Tolerance Verification of an Industrial Assembly using Computed Tomography

Stolfi, Alessandro ; De Chiffre, Leonardo ; Regi, Francesco
part of: Proceedings of the 11th International Conference on Multi-Material Micro Manufacture (4M2016), 2016, Research Publishing Services
Presented at:
4M/IWMF 2016 Conference

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2016

 

Traceability of Height Measurements on Green Sand Molds using Optical 3D Scanning

Mohaghegh, Kamran ; Yazdanbakhsh, S.A. ; Tiedje, N. S. ; De Chiffre, Leonardo
part of: Proceedings of the CastExpo & 120th Metalcasting Congress, 2016, American Foundry Society
Presented at:
CastExpo & 120th Metalcasting Congress

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2016

 

Traceability of optical length measurements on sand surfaces

Mohaghegh, Kamran ; Yazdanbakhsh, Seyed Alireza ; Tiedje, Niels Skat ; De Chiffre, Leonardo
part of: Proceedings of euspen’s 16th International Conference & Exhibition, 2016
Presented at:
euspen’s 16th International Conference & Exhibition

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2016

2015
 

Accurate characterisation of post moulding shrinkage of polymer parts

Neves, L. C. ; De Chiffre, L. ; González-Madruga, D. ; Dalla Costa, G. ; Jespersen, I.
part of: Proceedings of the 15th International Conference of the European Society for Precision Engineering and Nanotechnology, pages: 131-132, 2015, The European Society for Precision Engineering and Nanotechnology
Presented at:
15th euspen International Conference & Exhibition (2015)

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2015

 

A reverse engineering methodology for nickel alloy turbine blades with internal features

Gameros, A. ; De Chiffre, Leonardo ; Siller, H.R. ; Hiller, Jochen ; Genta, G.
in: CIRP Journal of Manufacturing Science and Technology, vol: 9, pages: 116-124

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2015     |    DOI: https://doi.org/10.1016/j.cirpj.2014.12.001

  PDF

CT Performance Evaluation Using Multi Material Assemblies

Stolfi, Alessandro ; De Chiffre, Leonardo
part of: Proceedings of Digital Industrial Radiology and Computed Tomography (DIT 2015), 2015
Presented at:
Digital Industrial Radiology and Computed Tomography

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2015

  PDF

Defining Allowable Physical Property Variations for High Accurate Measurements on Polymer Parts.

Mohammadi, Ali ; Sonne, Mads Rostgaard ; Madruga, Daniel González ; De Chiffre, Leonardo ; Hattel, Jesper Henri
part of: AIP Conference Proceedings, 2016, AIP Publishing LLC
Presented at:
13th International Conference of Numerical Analysis and Applied Mathematics 2015 (ICNAAM 2015)

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2015     |    DOI: https://doi.org/10.1063/1.4951804

 

Development of a multisensory arm for process monitoring in Robot Assisted Polishing

Pilny, Lukas ; Dalla Costa, Giuseppe ; Bissacco, Giuliano ; De Chiffre, Leonardo
part of: Proceedings of the 15th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2015, pages: 269-270, 2015
Presented at:
15th International Conference of the European Society for Precision Engineering and Nanotechnology

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2015

  PDF

Development of a multisensory arm for process monitoring in Robot Assisted Polishing

Pilny, Lukas ; Dalla Costa, Giuseppe ; Bissacco, Giuliano ; De Chiffre, Leonardo
Presented at:
15th International Conference of the European Society for Precision Engineering and Nanotechnology

Type: Poster (Peer reviewed)

Status: Published     |    Year: 2015

 

Dimensional measurements with submicrometer uncertainty in production environment

De Chiffre, L. ; Gudnason, M. M. ; Madruga, D.
part of: Proceedings of the 15th International Conference of the European Society for Precision Engineering and Nanotechnology, pages: 163-4, 2015
Presented at:
15th euspen International Conference & Exhibition (2015)

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2015

  PDF

Elastic-properties measurement at high temperatures through contact resonance atomic force microscopy

Marinello, Francesco ; Pezzuolo, Andrea ; Carmignato, Simone ; Savio, Enrico ; De Chiffre, Leonardo ; Sartori, Luigi ; Cavalli, Raffaele
in: Aip Conference Proceedings, vol: 1667
Presented at:
NANOFORUM 2014

Type: Conference article (Peer reviewed)

Status: Published     |    Year: 2015     |    DOI: https://doi.org/10.1063/1.4922565

 

Form measurements in an industrial CT scanner investigated using a polymer step gauge

Angel, J. ; Stolfi, Alessandro ; De Chiffre, Leonardo
part of: Proceedings of the 15th International Conference of the European Society for Precision Engineering and Nanotechnology, pages: 203-204, 2015, The European Society for Precision Engineering and Nanotechnology
Presented at:
15th euspen International Conference & Exhibition (2015)

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2015

 

Medium term stability investigation of polymer step gauges for CT scanner verification

Cantatore, A. ; Angel, J. ; De Chiffre, L.
part of: Proceedings of the 15th International Conference of the European Society for Precision Engineering and Nanotechnology, pages: 205-206, 2015
Presented at:
15th euspen International Conference & Exhibition (2015)

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2015

 

Off-line testing of multifunctional surfaces for metal forming applications

Godi, A. ; Grønbæk, J. ; De Chiffre, L.
in: CIRP Journal of Manufacturing Science and Technology, vol: 11, pages: 28-35

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2015     |    DOI: https://doi.org/10.1016/j.cirpj.2015.06.001

 

Performance evaluation of CT measurements made on step gauges using statistical methodologies

Angel, J. ; De Chiffre, L. ; Kruth, J.P. ; Tan, Y. ; Dewulf, W.
in: CIRP Journal of Manufacturing Science and Technology, vol: 11, pages: 68-72

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2015     |    DOI: https://doi.org/10.1016/j.cirpj.2015.08.002

 

Quantitative analysis of scaling error compensation methods in dimensional X-ray computed tomography

Müller, P. ; Hiller, Jochen ; Dai, Y. ; Andreasen, J. L. ; Hansen, Hans Nørgaard ; De Chiffre, Leonardo
in: CIRP Journal of Manufacturing Science and Technology, vol: 10, pages: 68-76

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2015     |    DOI: https://doi.org/10.1016/j.cirpj.2015.04.004

2014
 

A plateau–valley separation method for textured surfaces with a deterministic pattern

Godi, Alessandro ; Kühle, Anders ; De Chiffre, Leonardo
in: Precision Engineering, vol: 38, issue: 1, pages: 190-196

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2014     |    DOI: https://doi.org/10.1016/j.precisioneng.2013.06.001

  PDF

A reciprocating pin-on-plate test-rig for studying friction materials for holding brakes

Poulios, Konstantinos ; Drago, Nicola ; Klit, Peder ; De Chiffre, Leonardo
in: Wear, vol: 311, issue: 1-2, pages: 40-46

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2014     |    DOI: https://doi.org/10.1016/j.wear.2013.12.023

 

Benefit quantification of interoperability in coordinate metrology

Savio, E. ; Carmignato, S. ; De Chiffre, Leonardo
in: CIRP Annals : Manufacturing Technology, vol: 63, issue: 1, pages: 477-480

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2014     |    DOI: https://doi.org/10.1016/j.cirp.2014.03.037

  PDF

Centre for Industrial Application of CT scanning (CIA-CT) – Four years of results 2009-2013

De Chiffre, Leonardo ; Andreasen, Jan Lasson ; Christensen, Lars Bager ; Feidenhans'l, Robert Krarup ; Vinter, Brian ; Thestrup Jensen, Niels ; Arentoft, Mogens ; Buchard Jørgensen, Per ; Vester-Christensen, Martin ; Schmidt, Per René

Type: Report

Status: Published     |    Year: 2014

  PDF

Characterisation of surfaces produced by robot-assisted polishing (RAP)

Mohaghegh, Kamran ; De Chiffre, Leonardo
part of: Proceedings of the 14th euspen International Conference, 2014, euspen
Presented at:
14th International Conference of the European Society for Precision Engineering and Nanotechnology

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2014

 

Comparison on Computed Tomography using industrial items

Angel, Jais Andreas Breusch ; De Chiffre, Leonardo
in: C I R P Annals, vol: 63, pages: 473–476

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2014     |    DOI: https://doi.org/10.1016/j.cirp.2014.03.034

 

Estimation of measurement uncertainties in X-ray computed tomography metrology using the substitution method

Müller, Pavel ; Hiller, Jochen ; Dai, Y. ; Andreasen, J. L. ; Hansen, Hans Nørgaard ; De Chiffre, Leonardo
in: CIRP Journal of Manufacturing Science and Technology, vol: 7, issue: 3, pages: 222-232

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2014     |    DOI: https://doi.org/10.1016/j.cirpj.2014.04.002

 

Industrial applications of computed tomography

De Chiffre, Leonardo ; Carmignato, S. ; Kruth, J. -P. ; Schmitt, R. ; Weckenmann, A.
in: CIRP Annals : Manufacturing Technology, vol: 63, issue: 2, pages: 655-677

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2014     |    DOI: https://doi.org/10.1016/j.cirp.2014.05.011

  PDF

Inter laboratory comparison on Industrial Computed Tomography

Angel, Jais Andreas Breusch ; De Chiffre, Leonardo
Presented at:
5th International Conference on Industrial Computed Tomography

Type: Poster

Status: Published     |    Year: 2014

 

Measurement Uncertainty Evaluation in Dimensional X-ray Computed Tomography Using the Bootstrap Method

Hiller, Jochen ; Genta, Gianfranco ; Barbato, Giulio ; De Chiffre, Leonardo ; Levi, Raffaello
in: International Journal of Precision Engineering and Manufacturing, vol: 15, issue: 4, pages: 617-622

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2014     |    DOI: https://doi.org/10.1007/s12541-014-0379-9

  PDF

Reproducibility of a reaming test

Pilny, Lukas ; Müller, Pavel ; De Chiffre, Leonardo
in: International Journal of Manufacturing Research, vol: 9, issue: 2, pages: 157-172

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2014     |    DOI: https://doi.org/10.1504/IJMR.2014.062441

 

Simulation-aided investigation of beam hardening induced errors in CT dimensional metrology

Tan, Ye ; Kiekens, Kim ; Welkenhuyzen, Frank ; Angel, Jais Andreas Breusch ; De Chiffre, Leonardo ; Kruth, Jean-Pierre ; Dewulf, Wim
in: Measurement Science and Technology, vol: 25, issue: 6, pages: 064014

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2014     |    DOI: https://doi.org/10.1088/0957-0233/25/6/064014

  PDF

The effect of scattered light sensor orientation on roughness measurement of curved polished surfaces

Pilny, Lukas ; Bissacco, Giuliano ; De Chiffre, Leonardo
part of: Proceedings of the 14th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2014, pages: 233-236, 2014, euspen
Presented at:
14th International Conference of the European Society for Precision Engineering and Nanotechnology

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2014

  PDF

The effect of scattered light sensor orientation on roughness measurement of curved polished surfaces

Pilny, Lukas ; Bissacco, Giuliano ; De Chiffre, Leonardo
Presented at:
14th International Conference of the European Society for Precision Engineering and Nanotechnology

Type: Poster (Peer reviewed)

Status: Published     |    Year: 2014

 

Uncertainty of pin height measurement for the determination of wear in pin-on-plate test

Drago, Nicola ; De Chiffre, Leonardo ; Poulios, Konstantinos
in: CIRP Journal of Manufacturing Science and Technology, vol: 7, issue: 2, pages: 106-111

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2014     |    DOI: https://doi.org/10.1016/j.cirpj.2013.12.002

  PDF

Using grating based X-ray contrast modalities for metrology

Angel, Jais Andreas Breusch ; Lauridsen, T. ; Feidenhans'l, R. ; Nielsen, M.S. ; De Chiffre, Leonardo
part of: Proceedings of the 14th euspen International Conference, pages: 157-160, 2014, euspen
Presented at:
14th International Conference of the European Society for Precision Engineering and Nanotechnology

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2014

  PDF

Validation of in-line surface characterization by light scattering in Robot Assisted Polishing

Pilny, Lukas ; Bissacco, Giuliano ; De Chiffre, Leonardo
part of: Proceedings of the 3rd International Conference on Virtual Machining Process technology (VMPT), 2014
Presented at:
3rd International Conference on Virtual Machining Process Technology

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2014

2013
  PDF

Acoustic Emission Based In-process Monitoring in Robot Assisted Polishing

Pilny, Lukas ; Bissacco, Giuliano ; De Chiffre, Leonardo ; Ramsing, J.
Presented at:
11th International Symposium on Measurement Technology and Intelligent Instruments

Type: Paper (Peer reviewed)

Status: Published     |    Year: 2013

 

A new procedure for characterizing textured surfaces with a deterministic pattern of valley features

Godi, Alessandro ; Kühle, A ; De Chiffre, Leonardo
in: Measurement Science and Technology, vol: 24, issue: 8

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2013     |    DOI: https://doi.org/10.1088/0957-0233/24/8/085009

  PDF

A New Rig for Testing Textured Surfaces in Pure Sliding Conditions

Godi, Alessandro ; Grønbæk, J. ; Mohaghegh, Kamran ; Klit, Peder ; De Chiffre, Leonardo
in: Tribology Letters, vol: 50, issue: 3, pages: 397-405

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2013     |    DOI: https://doi.org/10.1007/s11249-013-0137-7

  PDF

Computed tomography as a tool for tolerance verification of industrial parts

Müller, Pavel ; Cantatore, Angela ; Andreasen, J.L. ; Hiller, Jochen ; De Chiffre, Leonardo
in: Procedia CIRP, vol: 10, pages: 125-132
Presented at:
12th CIRP Conference on Computer Aided Tolerancing

Type: Conference article (Peer reviewed)

Status: Published     |    Year: 2013     |    DOI: https://doi.org/10.1016/j.procir.2013.08.022

 

Final report on RMO key comparison EURAMET.L-K6: CMM 2-D artifact: ball plate

Jusko, O. ; Banreti, E. ; Bergmans, R. ; De Chiffre, Leonardo ; Lassila, A. ; Lewis, A. ; Ramotowski, Z. ; Saraiva, F. ; Thalmann, R ; Turner, P ; Zeleny, V
in: Metrologia, vol: 50, issue: 1A, pages: 04001

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2013     |    DOI: https://doi.org/10.1088/0026-1394/50/1A/04001

 

Forming of shape memory composite structures

Santo, Loredana ; Quadrini, Fabrizio ; De Chiffre, Leonardo
in: Key Engineering Materials, vol: 554-557, pages: 1930-1937
Presented at:
16th annual ESAFORM Conference on Material Forming

Type: Conference article (Peer reviewed)

Status: Published     |    Year: 2013     |    DOI: https://doi.org/10.4028/www.scientific.net/KEM.554-557.1930

  PDF

Simulation-aided investigation of beam hardening induced errors in CT dimensional metrology

Tan, Ye ; Kiekens, Kim ; Welkenhuyzen, Frank ; Angel, Jais Andreas Breusch ; De Chiffre, Leonardo ; Kruth, Jean-Pierre ; Dewulf, Wim
part of: The 11th International Symposium of Measurement Technology and Intelligent Instruments, 2013
Presented at:
11th International Symposium on Measurement Technology and Intelligent Instruments

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2013

  PDF

Testing of newly developed functional surfaces under pure sliding conditions

Godi, Alessandro ; Mohaghegh, Kamran ; Grønbæk, J. ; Klit, Peder ; De Chiffre, Leonardo
in: Tribology Letters, vol: 51, issue: 1, pages: 171-180

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2013     |    DOI: https://doi.org/10.1007/s11249-013-0162-6

2012
  PDF

An Axial Sliding Test for machine elements surfaces

Godi, Alessandro ; Grønbæk, J. ; Mohaghegh, Kamran ; Klit, Peder ; De Chiffre, Leonardo
part of: Proceedings of the 15th Nordic Symposium on Tribology , 2012
Presented at:
15th Nordic Symposium on Tribology

Type: Conference abstract in proceedings

Status: Published     |    Year: 2012

  PDF

A plateau-valley separation method for multifunctional surfaces characterization

Godi, Alessandro ; Kühle, A. ; De Chiffre, Leonardo
part of: Proceedings of the 12th euspen International Conference, 2012
Presented at:
12th euspen International Conference

Type: Article in proceedings

Status: Published     |    Year: 2012

  PDF

A study on evaluation strategies in dimensional X-ray computed tomography by estimation of measurement uncertainties

Müller, Pavel ; Hiller, Jochen ; Cantatore, Angela ; De Chiffre, Leonardo
in: International Journal of Metrology and Quality Engineering, vol: 3, issue: 2, pages: 107-115

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2012     |    DOI: https://doi.org/10.1051/ijmqe/2012011

 

Evaluation of metrology technologies for free form surfaces

Arámbula, K. ; Siller, H.R. ; De Chiffre, Leonardo ; Rodríguez, C.A. ; Cantatore, Angela
in: International Journal of Metrology and Quality Engineering, vol: 3, issue: 1, pages: 55

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2012

 

Hole quality and burr reduction in drilling aluminium sheets

Pilny, Lukas ; De Chiffre, Leonardo ; Piska, Miroslav ; Villumsen, Morten F.
in: CIRP Journal of Manufacturing Science and Technology, vol: 5, pages: 102-107

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2012     |    DOI: https://doi.org/10.1016/j.cirpj.2012.03.005

  PDF

Inter-RMO Key Comparison EUROMET.L-K5.2004: Calibration of a step gauge

Prieto, Emilio ; Brown, Nicholas ; Lassila, Antti ; Lewis, Andrew ; Matus, Michael ; Vailleau, Georges ; De Chiffre, Leonardo ; Kotte, Gerard W J L ; Frennberg, Mikael ; McQuoid, Howard ; Zelený, Vít ; Ramotowski, Zbigniew ; Bánréti, Edit ; Duta, Alexandru ; Picotto, Gian Bartolo ; Doytchinov, Kostadin ; Valente de Oliveira, Jose Carlos ; Alonso, Miguel Viliesid ; Chekirda, Konstantin
in: Metrologia, vol: 49, issue: 1A, pages: 04008

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2012     |    DOI: https://doi.org/10.1088/0026-1394/49/1A/04008

  PDF

Investigation on the influence of image quality in X-ray CT metrology

Müller, Pavel ; Hiller, Jochen ; Cantatore, Angela ; Bartscher, Markus ; De Chiffre, Leonardo
Presented at:
4th International Conference on Industrial Computed Tomography

Type: Paper (Peer reviewed)

Status: Published     |    Year: 2012

  PDF

Material investigation for manufacturing of reference step gauges for CT scanning verification

Cantatore, Angela ; Angel, Jais Andreas Breusch ; De Chiffre, Leonardo
part of: Proceedings of the 12th euspen International Conference, 2012
Presented at:
12th euspen International Conference

Type: Article in proceedings

Status: Published     |    Year: 2012

  PDF

New reference object for metrological performance testing of industrial CT systems

Müller, Pavel ; Hiller, Jochen ; Cantatore, Angela ; Tosello, Guido ; De Chiffre, Leonardo
part of: Proceedings of the 12th euspen International Conference, 2012
Presented at:
12th euspen International Conference

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2012

  PDF

Preliminary results of a proficiency testing of industrial CT scanners using small polymer items

Angel, Jais Andreas Breusch ; Cantatore, Angela ; De Chiffre, Leonardo
part of: Proceedings of the 12th euspen International Conference, 2012
Presented at:
12th euspen International Conference

Type: Article in proceedings

Status: Published     |    Year: 2012

 

Reaming process improvement and control: An application of statistical engineering

Müller, Pavel ; Genta, G. ; Barbato, G. ; De Chiffre, Leonardo ; Levi, R.
in: CIRP Journal of Manufacturing Science and Technology, vol: 5, issue: 3, pages: 196-201

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2012     |    DOI: https://doi.org/10.1016/j.cirpj.2012.07.005