Henning Friis Poulsen

Henning Friis Poulsen


Department of Physics

Technical University of Denmark


Building 307, room 246

2800 Kgs. Lyngby

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In-operando observation of microstructural evolution in a solid oxide cell electrolyte operating at high polarization

Sierra, J. X. ; Poulsen, H. F. ; Jørgensen, P. S. ; Detlefs, C. ; Cook, P. ; Simons, H. ; Jakobsen, A. C. ; Bowen, J. R.
in: Journal of Power Sources, vol: 413, pages: 351-359

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2019     |    DOI: https://doi.org/10.1016/j.jpowsour.2018.12.057


Mapping of individual dislocations with dark field x-ray microscopy

Jakobsen, A.C. ; Simons, H. ; Ludwig, W. ; Yildirim, C. ; Leemreize, H. ; Porz, L. ; Detlefs, C. ; Poulsen, H.F.
in: Journal of Applied Crystallography, vol: 52, issue: 1, pages: 122-132

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2019     |    DOI: https://doi.org/10.1107/S1600576718017302


Missing information and data fidelity in digital microstructure acquisition

Bao, Chongbing ; Ji, Chuanyi ; Poulsen, Henning Friis ; Li, Mo
in: Acta Materialia, vol: 173, pages: 262-269

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2019     |    DOI: https://doi.org/10.1016/j.actamat.2019.05.012


Multigrain crystallography and three-dimensional grain mapping

Poulsen, Henning Friis ; Vaughan, G. B. M.
part of: International Tables for Crystallography, pages: 601-616, 2019

Type: Book chapter (Peer reviewed)

Status: Published     |    Year: 2019     |    DOI: https://doi.org/10.1107/97809553602060000970


Multilayer Laue lenses at high X-ray energies: performance and applications

Murray, Kevin T. ; Pedersen, Anders Filsøe ; Mohacsi, Istvan ; Detlefs, Carsten ; Morgan, Andrew J. ; Prasciolu, Mauro ; Yildirim, Can ; Simons, Hugh ; Jakobsen, Anders Clemen ; Chapman, Henry N. ; Poulsen, Henning Friis ; Bajt, Saša
in: Optics Express, vol: 27, issue: 5, pages: 7120-7138

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2019     |    DOI: https://doi.org/10.1364/OE.27.007120


Non-destructive mapping of long-range dislocation strain fields in an epitaxial complex metal oxide

Simons, Hugh ; Jakobsen, Anders Clemen ; Ahl, Sonja Rosenlund ; Poulsen, Henning Friis ; Pantleon, Wolfgang ; Chu, Ying-Hao ; Detlefs, Carsten ; Valanoor, Nagarajan
in: Nano letters, vol: 19, issue: 3, pages: 1445-1450

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2019     |    DOI: https://doi.org/10.1021/acs.nanolett.8b03839


The ESRF dark-field x-ray microscope at ID06

Kutsal, M. ; Bernard, P. ; Berruyer, G. ; Cook, P. K. ; Hino, R. ; Jakobsen, A. C. ; Ludwig, W. ; Ormstrup, Jeppe ; Roth, T. ; Simons, Hugh ; Smets, K. ; Sierra, J. X. ; Wade, J. ; Wattecamps, P. ; Yildirim, C. ; Poulsen, Henning Friis ; Detlefs, C.
in: I O P Conference Series: Materials Science and Engineering, vol: 580, issue: 1
Presented at:
40th Risø International Symposium on Material Science: Metal Microstructures in 2D, 3D, and 4D

Type: Conference article (Peer reviewed)

Status: Published     |    Year: 2019     |    DOI: https://doi.org/10.1088/1757-899X/580/1/012007


X-ray multigrain crystallography

Wejdemann, Christian ; Poulsen, Henning F ; Lauridsen, Erik M
Patent no.: US10139357, Date: 2016-08-04

Type: Patent

Status: Published     |    Year: 2019


A spectral geometric model for Compton single scatter in PET based on the single scatter simulation approximation

Kazantsev, I.G. ; Olsen, Ulrik Lund ; Poulsen, Henning Friis ; Hansen, Per Christian
in: Inverse Problems, vol: 34, issue: 2

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2018     |    DOI: https://doi.org/10.1088/1361-6420/aaa05d


Imbibition in plant seeds

Louf, Jean-Francois ; Zheng, Yi ; Kumar, Aradhana ; Bohr, Tomas ; Gundlach, Carsten ; Harholt, Jesper ; Poulsen, Henning Friis ; Jensen, Kaare Hartvig
in: Physical Review E, vol: 98, issue: 4

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2018     |    DOI: https://doi.org/10.1103/PhysRevE.98.042403