Ulrik Lund Olsen

Ulrik Lund Olsen

Senior Research Engineer

DTU PHYSICS
Department of Physics

Technical University of Denmark

Fysikvej

Building 307, room 252

2800 Kgs. Lyngby

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2018
 

A spectral geometric model for Compton single scatter in PET based on the single scatter simulation approximation

Kazantsev, I.G. ; Olsen, Ulrik Lund ; Poulsen, Henning Friis ; Hansen, Per Christian
in: Inverse Problems, vol: 34, issue: 2

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2018     |    DOI: https://doi.org/10.1088/1361-6420/aaa05d

  PDF

Simulation tools for scattering corrections in spectrally resolved X-ray Computed Tomography using McXtrace

Busi, Matteo ; Olsen, Ulrik L. ; Knudsen, Erik B. ; Frisvad, Jeppe R. ; Kehres, Jan ; Dreier, Erik S.
in: Optical Engineering, vol: 57, issue: 3

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2018     |    DOI: https://doi.org/10.1117/1.OE.57.3.037105

  PDF

Spectral correction algorithm for multispectral CdTe x-ray detectors

Dreier, Erik Schou ; Kehres, Jan ; Khalil, Mohamad ; Busi, Matteo ; Gu, Yun ; Feidenhans'l, Robert Krarup ; Olsen, Ulrik Lund
in: Optical Engineering, vol: 57, issue: 5

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2018     |    DOI: https://doi.org/10.1117/1.OE.57.5.054117

 

Subpixel resolution in CdTe Timepix3 pixel detectors

Khalil, Mohamad ; Dreier, Erik Schou ; Kehres, Jan ; Jakubek, Jan ; Olsen, Ulrik Lund
in: Journal of Synchrotron Radiation, vol: 25, issue: 6, pages: 1650-1657

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2018     |    DOI: https://doi.org/10.1107/S1600577518013838

2017
  PDF

A METHOD OF SECURITY SCANNING OF CARRY-ON ITEMS, AND A CARRY-ON ITEMS SECURITY SCANNING SYSTEM

Poulsen, Henning Friis ; Olsen, Ulrik Lund ; Kehres, Jan
Patent no.: WO2017005757, Date: 2017-01-12

Type: Patent

Status: Published     |    Year: 2017

  PDF

A Monte Carlo simulation of scattering reduction in spectral x-ray computed tomography

Busi, Matteo ; Olsen, Ulrik Lund ; Bergbäck Knudsen, Erik ; Frisvad, Jeppe Revall ; Kehres, Jan ; Christensen, Erik D. ; Khalil, Mohamad ; Haldrup, Kristoffer
part of: Advances in Computational Methods for X-Ray Optics IV, 2017, SPIE - International Society for Optical Engineering
Presented at:
SPIE Optics + Photonics 2017

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: https://doi.org/10.1117/12.2273763

  PDF

Detector response artefacts in spectral reconstruction

Olsen, Ulrik Lund ; Christensen, Erik D. ; Khalil, Mohamad ; Gu, Yun ; Kehres, Jan
part of: Proc. SPIE 10391, Developments in X-Ray Tomography XI, 2017, SPIE - International Society for Optical Engineering
Presented at:
SPIE Optics + Photonics 2017

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: https://doi.org/10.1117/12.2272564

  PDF

Multispectral x-ray CT: multivariate statistical analysis for efficient reconstruction

Kheirabadi, Mina ; Mustafa, Wail ; Lyksborg, Mark ; Olsen, Ulrik Lund ; Dahl, Anders Bjorholm
part of: Proceedings Volume 10391, Developments in X-Ray Tomography XI, 2017, SPIE - International Society for Optical Engineering
Presented at:
SPIE Optics + Photonics 2017

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: https://doi.org/10.1117/12.2273338

  PDF

Spectral correction algorithm for multispectral CdTe x-ray detectors

Christensen, Erik D. ; Kehres, Jan ; Gu, Yun ; Feidenhans’l, Robert ; Olsen, Ulrik Lund
part of: Proc. SPIE 10403, Infrared Remote Sensing and Instrumentation XXV, 2017, SPIE - International Society for Optical Engineering
Presented at:
SPIE Optics + Photonics 2017

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: https://doi.org/10.1117/12.2272935

  PDF

Threat detection of liquid explosives and precursors from their x-ray scattering pattern using energy dispersive detector technology

Kehres, Jan ; Olsen, Ulrik Lund ; Lyksborg, Mark
part of: Proc. SPIE 10403, Infrared Remote Sensing and Instrumentation XXV, 2017, SPIE - International Society for Optical Engineering
Presented at:
SPIE Optics + Photonics 2017

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: https://doi.org/10.1117/12.2274519