Leonardo De Chiffre

Leonardo De Chiffre

Professor

DTU MECHANICAL ENGINEERING
Department of Mechanical Engineering

Section of Manufacturing Engineering

Technical University of Denmark

Produktionstorvet

Building 425, room 206

2800 Kgs. Lyngby

Ph.
Fax +45 45 25 19 61
E-mail ldch@mek.dtu.dk
ORCID 0000-0002-6141-9580
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2019
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Roughness Investigation of SLM Manufactured Conformal Cooling Channels Using X-ray Computed Tomography

Klingaa, Christopher G. ; Bjerre, Mathias K. ; Baier, Sina ; De Chiffre, Leonardo ; Mohanty, Sankhya ; Hattel, Jesper H.
Presented at:
9th Conference on Industrial Computed Tomography (ICT2019)

Type: Paper (Peer reviewed)

Status: Published     |    Year: 2019

2018
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Accurate measurements in a production environment using dynamic length metrology (DLM)

Chiffre, L. De ; González-Madruga, D. ; Costa, G. Dalla ; Sonne, M.R. ; Mohammadi, A. ; Hattel, J.H. ; Hansen, H.N. ; Mohaghegh, K. ; Meftahpour, M. ; Meinertz, J. ; Meinertz, C.
in: Procedia CIRP, vol: 75, pages: 343-348
Presented at:
15th CIRP Conference on Computer Aided Tolerancing (CIRP CAT 2018)

Type: Conference article (Peer reviewed)

Status: Published     |    Year: 2018     |    DOI: https://doi.org/10.1016/j.procir.2018.04.074

  PDF

Applicability of Acoustic Emission monitoring to micro polishing

Ben Achour, Soufian ; Bissacco, Giuliano ; De Chiffre, L.
Presented at:
18th International Conference of the european Society for Precision Engineering and Nanotechnology (euspen 18)

Type: Conference abstract for conference (Peer reviewed)

Status: Published     |    Year: 2018

 

A simple model linking surface roughness with friction coefficient and manufacturing cost

De Chiffre, L. ; Kücükyildiz, Ô. C. ; Bay, N.
in: Key Engineering Materials, vol: 767 , pages: 275-282

Type: Conference article (Peer reviewed)

Status: Published     |    Year: 2018     |    DOI: https://doi.org/10.4028/www.scientific.net/KEM.767.275

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Automated contact area measurement on structured surfaces

Kücükyildiz, Ömer C. ; Jensen, Sebastian H. N. ; De Chiffre, Leonardo
Presented at:
18th International Conference of the european Society for Precision Engineering and Nanotechnology (euspen 18)

Type: Conference abstract for conference (Peer reviewed)

Status: Published     |    Year: 2018

 

Characterization of holding brake friction pad surface after pin-on-plate wear test

Drago, N. ; Gonzalez Madruga, D. ; De Chiffre, L.
in: Surface Topography: Metrology and Properties, vol: 6, issue: 1

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2018     |    DOI: https://doi.org/10.1088/2051-672X/aaabd3

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Compensation of in-line metrology of polymer parts based on 3D thermomechanical analyses

Sonne, M.R. ; Costa, G. Dalla ; Madruga, D.G. ; Chiffre, L. De ; Hattel, J.H.
in: Procedia CIRP, vol: 75, pages: 349-354
Presented at:
15th CIRP Conference on Computer Aided Tolerancing (CIRP CAT 2018)

Type: Conference article (Peer reviewed)

Status: Published     |    Year: 2018     |    DOI: https://doi.org/10.1016/j.procir.2018.04.083

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Considerations on numerical modelling for compensation of in-process metrology in manufacturing

Sonne, M. R. ; Mohammadi, A. ; Dalla Costa, G. ; Madruga, D. G. ; De Chiffre, L. ; Hattel, J. H.
Presented at:
18th International Conference of the european Society for Precision Engineering and Nanotechnology (euspen 18)

Type: Conference abstract for conference (Peer reviewed)

Status: Published     |    Year: 2018

 

Effects of subsurface scattering on the accuracy of optical 3D measurements using miniature polymer step gauges

Wilm, Jakob ; Madruga, Daniel González ; Jensen, Janus Nørtoft ; Gregersen, Søren Kimmer Schou ; Doest, Mads Emil Brix ; Guerra, Maria Grazia ; Aanæs, Henrik ; De Chiffre, Leonardo
part of: Proceedings of euspen‘s 18th International Conference and Exhibition, pages: 449-450, 2018
Presented at:
18th International Conference of the european Society for Precision Engineering and Nanotechnology (euspen 18)

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2018

 

Error sources

Stolfi, Alessandro ; De Chiffre, Leonardo ; Kasperl, Stefan
part of: Industrial X-Ray Computed Tomography, pages: 143-184, 2018, Springer

Type: Book chapter (Peer reviewed)

Status: Published     |    Year: 2018     |    DOI: https://doi.org/10.1007/978-3-319-59573-3_5