Henning Friis Poulsen

Henning Friis Poulsen

Professor

DTU FYSIK
Institut for Fysik

Danmarks Tekniske Universitet

Fysikvej

Bygning 307, rum 246

2800 Kgs. Lyngby

Hjemmeside

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2018
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The fractional Fourier transform as a simulation tool for lens-based X-ray microscopy

Pedersen, Anders Filsøe ; Simons, Hugh ; Detlefs, Carsten ; Poulsen, Henning Friis
in: Journal of Synchrotron Radiation, vol: 25, issue: 3

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2018     |    DOI: https://doi.org/10.1107/S1600577518003028

 

Three-dimensional grain growth in pure iron. Part I. statistics on the grain level

Zhang, Jin ; Zhang, Yubin ; Ludwig, Wolfgang ; Rowenhorst, David ; Voorhees, Peter W. ; Poulsen, Henning Friis
in: Acta Materialia, vol: 156, pages: 76-85

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2018     |    DOI: https://doi.org/10.1016/j.actamat.2018.06.021

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X-ray coherent diffraction imaging with an objective lens: towards 3D mapping of thick polycrystals

Pedersen, Anders Filsøe ; Chamard, Virginie ; Detlefs, Carsten ; Zhou, Tao ; Carbone, Dina ; Poulsen, Henning Friis
in: Nature Photonics

Type: Journal article (Peer reviewed)

Status: Submitted     |    År: 2018

2017
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HIGH PRECISION COMPUTED TOMOGRAPHY FOR METROLOGY

Gundlach, Carsten ; Poulsen, Henning Friis
Patent no.: WO2017186804, Date: 2017-11-02

Type: Patent

Status: Published     |    År: 2017

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A METHOD OF SECURITY SCANNING OF CARRY-ON ITEMS, AND A CARRY-ON ITEMS SECURITY SCANNING SYSTEM

Poulsen, Henning Friis ; Olsen, Ulrik Lund ; Kehres, Jan
Patent no.: WO2017005757, Date: 2017-01-12

Type: Patent

Status: Published     |    År: 2017

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Determining material parameters using phase-field simulations and experiments

Zhang, Jin ; Poulsen, Stefan O. ; Gibbs, John W. ; Voorhees, Peter W. ; Poulsen, Henning Friis
in: Acta Materialia, vol: 129, pages: 229-238

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2017     |    DOI: https://doi.org/10.1016/j.actamat.2017.02.056

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In operando studies of an yttria stabilized zirconia electrolyte supported symmetric solid oxide cell by Dark field X-ray Microscopy at ID06

Sierra, J. X. ; Jørgensen, P. S. ; Poulsen, H. F. ; Detlefs, C. ; Cook, P. ; Simons, H. ; Bowen, J. R.
Presented at:
ESRF User Meeting 2017

Type: Conference abstract for conference

Status: Published     |    År: 2017

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In operando studies of ScYSZ electrolyte supported symmetric solid oxide cell by X-ray Diffraction at ESRF, ID06 Beamline

Sierra, J. X. ; Poulsen, H. F. ; Jørgensen, P. S. ; Detlefs, C. ; Cook, P. ; Simons, H. ; Yildirim, C. ; Ahl, S. R. ; Jakobsen, A. C. ; Kantor, I. ; Bowen, J. R.
Presented at:
3rd International Conference on Tomography of 3D Materials and Structures

Type: Poster

Status: Published     |    År: 2017

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Simulating and optimizing compound refractive lens-based X-ray microscopes

Simons, Hugh ; Ahl, Sonja Rosenlund ; Poulsen, Henning Friis ; Detlefs, Carsten
in: Journal of Synchrotron Radiation, vol: 24, issue: 2, pages: 392-401

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2017     |    DOI: https://doi.org/10.1107/S160057751602049X