Hugh Simons

Hugh Simons

Adjunkt

DTU FYSIK
Institut for Fysik

Danmarks Tekniske Universitet

Fysikvej

Bygning 307, rum 242

2800 Kgs. Lyngby

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2017
 

Ultra-low-angle boundary networks within recrystallizing grains

Ahl, Sonja Rosenlund ; Simons, Hugh ; Zhang, Yubin ; Detlefs, C. ; Stöhr, Frederik ; Jakobsen, Anders Clemen ; Juul Jensen, Dorte ; Poulsen, Henning Friis
in: Scripta Materialia, vol: 139, pages: 87-91

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2017     |    DOI: https://doi.org/10.1016/j.scriptamat.2017.06.016

  PDF

X-ray diffraction microscopy based on refractive optics

Poulsen, Henning Friis ; Jakobsen, A. C. ; Simons, Hugh ; Ahl, Sonja Rosenlund ; Cook, P. K. ; Detlefs, C.
in: Journal of Applied Crystallography, vol: 50, issue: 5, pages: 1441-1456

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2017     |    DOI: https://doi.org/10.1107/S1600576717011037

2016
  PDF

Dual strain mechanisms in a lead-free morphotropic phase boundary ferroelectric

Walker, Julian ; Simons, Hugh ; Alikin, Denis O ; Turygin, Anton P ; Shur, Vladimir Y ; Kholkin, Andrei L ; Ursic, Hana ; Bencan, Andreja ; Malic, Barbara ; Nagarajan, Valanoor ; Rojac, Tadej
in: Scientific Reports, vol: 6

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2016     |    DOI: https://doi.org/10.1038/srep19630

  PDF

Full-field hard x-ray microscopy with interdigitated silicon lenses

Simons, Hugh ; Stöhr, Frederik ; Michael-Lindhard, Jonas ; Jensen, Flemming ; Hansen, Ole ; Detlefs, Carsten ; Poulsen, Henning Friis
in: Optics Communications, vol: 359, pages: 460-464

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2016     |    DOI: https://doi.org/10.1016/j.optcom.2015.09.103

 

Multiscale 3D characterization with dark-field x-ray microscopy

Simons, Hugh ; Jakobsen, Anders Clemen ; Ahl, Sonja Rosenlund ; Detlefs, Carsten ; Poulsen, Henning Friis
in: Mrs Bulletin, vol: 41, issue: 6, pages: 454-459

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2016     |    DOI: https://doi.org/10.1557/mrs.2016.114

 

Quantifying the onset of recrystallization in deformed metals using x-rays

Ahl, Sonja Rosenlund ; Simons, Hugh ; Poulsen, Henning Friis
Presented at:
Sustain-ATV Conference 2016

Type: Conference abstract for conference (Peer reviewed)

Status: Published     |    År: 2016

 

Reversible Polarization Rotation in Epitaxial Ferroelectric Bilayers

Liu, Guangqing ; Zhang, Qi ; Huang, Hsin-Hui ; Munroe, Paul ; Nagarajan, Valanoor ; Simons, Hugh ; Hong, Zijian ; Chen, Long-Qing
in: Advanced Materials Interfaces

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2016     |    DOI: https://doi.org/10.1002/admi.201600444

  PDF

Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics

Gorfman, S. ; Simons, Hugh ; Iamsasri, T. ; Prasertpalichat, S. ; Cann, D. P. ; Choe, H. ; Pietsch, U. ; Watier, Y. ; Jones, J. L.
in: Scientific Reports, vol: 6

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2016     |    DOI: https://doi.org/10.1038/srep20829

  PDF

Temperature dependent piezoelectric response and strain-electric-field hysteresis of rare-earth modified bismuth ferrite ceramics

Walker, Julian ; Ursic, Hana ; Bencan, Andreja ; Malic, Barbara ; Simons, Hugh ; Reaney, Ian ; Viola, Giuseppe ; Nagarajan, Valanoor ; Rojac, Tadej
in: Journal of Materials Chemistry C, vol: 4, issue: 33, pages: 7859-7868

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2016     |    DOI: https://doi.org/10.1039/c6tc02000c

2015
  PDF

Dark-field X-ray microscopy for multiscale structural characterization

Simons, Hugh ; King, A. ; Ludwig, W. ; Detlefs, C. ; Pantleon, Wolfgang ; Schmidt, Søren ; Snigireva, I. ; Stöhr, Frederik ; Snigirev, A. ; Poulsen, Henning Friis
in: Nature Communications, vol: 6

Type: Journal article (Peer reviewed)

Status: Published     |    År: 2015     |    DOI: https://doi.org/10.1038/ncomms7098