Peter Lindquist Henriksen

Peter Lindquist Henriksen

Ph.d.-studerende

DTU SPACE
Institut for Rumforskning og Rumteknologi

Astrofysik og atmosfærefysik

Danmarks Tekniske Universitet

Elektrovej

Bygning 327, rum 205

2800 Kgs. Lyngby

Tlf.
Fax 45 25 95 75
E-mail plihen@space.dtu.dk
ORCID 0000-0002-5903-1878

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2019
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Installation and commissioning of the silicon pore optics coating facility for the ATHENA mission

Massahi, S. ; Christensen, F. E. ; Ferreira, D. D. MDella Monica F ; Jafari, A. ; Svendsen, S. ; Henriksen, P. L. ; Shortt, B. ; Ferreira, I. ; Bavdaz, M. ; Collon, M. ; Landgraf, B. ; Girou, D.A. ; Langer, A. ; Schönberger, W. ; Wellner, T. ; Krumrey, M. ; Cibik, L.
part of: Proceedings of SPIE 11119, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX, 2019, SPIE - International Society for Optical Engineering
Presented at:
2019 SPIE Optical Engineering + Applications

Type: Article in proceedings (Peer reviewed)

Status: Published     |    År: 2019     |    DOI: https://doi.org/10.1117/12.2528351

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LEXR: A low-energy X-ray reflectometer for characterization of ATHENA mirror coatings

Henriksen, P. L. ; Christensen, F. E. ; Massahi, S. ; Ferreira, D. D. M. ; Svendsen, S. ; Jafari, A. ; Shortt, B.
part of: Proceedings of SPIE 11119, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX, 2019, SPIE - International Society for Optical Engineering
Presented at:
2019 SPIE Optical Engineering + Applications

Type: Article in proceedings (Peer reviewed)

Status: Published     |    År: 2019     |    DOI: https://doi.org/10.1117/12.2528144

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Performance and time stability of Ir/SiC X-ray mirror coatings for ATHENA

Svendsen, S. ; Massahi, S. ; Ferreira, D. D. M. ; Christensen, F. E. ; Jafari, A. ; Henriksen, P. L. ; Collon, M. ; Landgraf, B. ; Girou, D. ; Krumrey, M. ; Cibik, L. ; Schubert, A. ; Handick, E. ; Shortt, B.
part of: Proceedings of SPIE 11119, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX, pages: 107 - 116, 2019, SPIE - International Society for Optical Engineering
Presented at:
2019 SPIE Optical Engineering + Applications

Type: Article in proceedings (Peer reviewed)

Status: Published     |    År: 2019     |    DOI: https://doi.org/10.1117/12.2528664

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X-ray reflectometry of a platinum coating as reference sample for the ATHENA coating development

Jafari, A. ; Christensen, F. E. ; Massahi, S. ; Svendsen, S. ; Vu, L. M. ; Henriksen, P. L. ; Shortt, B. ; Krumrey, M. ; Cibik, L. ; Handick, E. ; Ferreira, D. D. M.
part of: Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX, pages: 111191K-111191K-7, 2019, SPIE - International Society for Optical Engineering
Presented at:
2019 SPIE Optical Engineering + Applications

Type: Article in proceedings (Peer reviewed)

Status: Published     |    År: 2019     |    DOI: https://doi.org/10.1117/12.2527557