Leonardo De Chiffre

Leonardo De Chiffre

Professor

DTU MECHANICAL ENGINEERING
Department of Mechanical Engineering

Section of Manufacturing Engineering

Technical University of Denmark

Produktionstorvet

Building 425, room 206

2800 Kgs. Lyngby

Ph.
Fax +4545 25 19 61
E-mail ldch@mek.dtu.dk
ORCID 0000-0002-6141-9580
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2018
 

Effects of subsurface scattering on the accuracy of optical 3D measurements using miniature polymer step gauges

Wilm, Jakob ; Madruga, Daniel González ; Jensen, Janus Nørtoft ; Gregersen, Søren Kimmer Schou ; Doest, Mads Emil Brix ; Guerra, Maria Grazia ; Aanæs, Henrik ; De Chiffre, Leonardo
part of: Proceedings of the 18th International Conference of the European Society for Precision Engineering and Nanotechnology, pages: 449-450, 2018, The European Society for Precision Engineering and Nanotechnology
Presented at:
18th International Conference of the european Society for Precision Engineering and Nanotechnology (euspen 18)

Type: Conference abstract in proceedings (Peer reviewed)

Status: Published     |    Year: 2018

 

Error sources

Stolfi, Alessandro ; De Chiffre, Leonardo ; Kasperl, Stefan
part of: Industrial X-Ray Computed Tomography, pages: 143-184, 2018, Springer

Type: Book chapter (Peer reviewed)

Status: Published     |    Year: 2018     |    DOI: https://doi.org/10.1007/978-3-319-59573-3_5

  PDF

Interlaboratory Comparison of a physical and a virtual assembly measured by CT

Stolfi, Alessandro ; De Chiffre, Leonardo
in: Precision Engineering, vol: 51, pages: 263-270

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2018     |    DOI: https://doi.org/10.1016/j.precisioneng.2017.08.018

  PDF

Post moulding thermal characterization of polymer components

D. Costa, G. ; González-Madruga, D. ; De Chiffre, L.
part of: Proceedings of the 18th International Conference of the European Society for Precision Engineering and Nanotechnology, pages: 469-470 , 2018, The European Society for Precision Engineering and Nanotechnology
Presented at:
18th International Conference of the european Society for Precision Engineering and Nanotechnology (euspen 18)

Type: Conference abstract in proceedings (Peer reviewed)

Status: Published     |    Year: 2018

 

Predicting the reference length of polymer parts with micrometer uncertainty measured under non-reference conditions

Mohammadi, A. ; Sonne, M. R. ; Dalla Costa, G. ; González-Madruga, D. ; De Chiffre, L. ; Hattel, J. H.
in: Precision Engineering, vol: 54, pages: 344-352

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2018     |    DOI: https://doi.org/10.1016/j.precisioneng.2018.07.003

2017
  PDF

GEOMETRICAL CALIBRATION OF X-RAY CT SCANNERS

Stolfi, Alessandro ; De Chiffre, Leonardo
Patent no.: EP3195802, Date: 2017-07-26

Type: Patent

Status: Published     |    Year: 2017

 

Characterisation and full-scale production testing of multifunctional surfaces for deep drawing applications

Godi, Alessandro ; Grønbæk, J. ; De Chiffre, Leonardo
in: C I R P - Journal of Manufacturing Science and Technology, vol: 16, pages: 64–71

Type: Journal article (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: https://doi.org/10.1016/j.cirpj.2016.07.001

  PDF

Characterizing Green Fiber Bottle Prototypes Using Computed Tomography

Saxena, Prateek ; Bissacco, Giuliano ; Stolfi, Alessandro ; De Chiffre, Leonardo
part of: Proceedings of the 7th Conference on Industrial Computed Tomography (iCT 2017), 2017
Presented at:
7th Conference on Industrial Computed Tomography (iCT 2017)

Type: Article in proceedings (Peer reviewed)

Status: Published     |    Year: 2017

  PDF

Material testing of copper by extrusion-cutting

Segalina, F. ; De Chiffre, Leonardo
in: Procedia CIRP, vol: 58, pages: 375-380
Presented at:
16th CIRP Conference on Modelling of Machining Operations

Type: Conference article (Peer reviewed)

Status: Published     |    Year: 2017     |    DOI: https://doi.org/10.1016/j.procir.2017.03.240